2 PANalytical MRD for texture analysis (LMC)

PANalytical MRD for texture analysis and µXRD

PANalytical X'Pert Pro MRD (materials research diffractometer) 4-axes X-ray diffractometer both for texture analysis as well as space-resolved X-ray diffraction of thin films.

» X-ray lens with point focus and parallel beam

  • texture analysis (pole figures, orientation distribution functions (ODFs))
  • in-plane X-ray diffraction
  • temperature-dependent texture analysis from RT to 1100°C (Anton Paar DHS1100)

» Optional set-up I: Mono-capillary for µXRD

  • space-resolved X-ray diffraction, e.g. for lateral mapping (focus width ≈ 120 µm)

» Optional set-up II: X-ray mirror with automatic beam attenuator

  • grazing incidence XRD
  • omega scans
  • reflectometry

» Equipment

  • Eulerian cradle (Omega, Phi, Psi)
  • X-ray lens with adjustable cross slits
  • 230 mm x 0.1 mm mono-capillary
  • X-ray mirror with automatic beam attenuator
  • Xe point detector

PANalytical MRD for texture measurement

PANalytical MRD for texture measurement

Left: Setup with X-ray lens for texture analysis. Right: Pole figures of a CISe absorber thin film.

Left: Setup with X-ray lens for texture analysis. Right: Pole figures of a CISe absorber thin film.

Left: Setup with 230 mm x 0.1 mm mono-capillary for µXRD. Right: Lateral µXRD mapping on a CZTSe absorber thin film.

Left: Setup with 230 mm x 0.1 mm mono-capillary for µXRD. Right: Lateral µXRD mapping on a CZTSe absorber thin film.

Left: Setup with X-ray mirror and automatic beam attenuator for GIXRD/XRR. Right: 2Theta-Omega scan of BaTiO3 on Si substrate.

Left: Setup with X-ray mirror and automatic beam attenuator for GIXRD/XRR. Right: 2Theta-Omega scan of BaTiO3 on Si substrate.