Expertise & Techniques

Imaging techniques provide insights into the interior of materials.

• Radiography
• Tomography
• Transmission electron microscopy

With diffraction methods a variety of structural properties in the micro and nanometer range can be investigated.

• Residual stress analysis utilizing X-ray & neutron diffraction
• Reflectometry für invenstigation of thin films and interfaces
• Characterization of polymers using small-angle scattering

• Cathode material characterisation using EXAFS & XANES
• Thermoelectric materials (RIXS)
• Optimization of material surfaces using XPS

• Gamma irradiation
• Magnetization, conductivity, polarization…
• Supralab (superconducting radio-frequency systems and cryogenic applications)

• Crystal growth & sample preparation
• Processing & production of optical components