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The activities in the department of microstructure and residual stress analysis aim at the characterization of structure and properties of matter across different length scales, ranging from nano- to macroscopic dimensions. The in-house research focuses on the development and enhancement of laboratory-based X-ray diffraction and scattering methods for nano- and microstructure, residual stress and texture analysis as well as their use in time- and spatially-resolved in- and ex-situ investigations and application to a broad spectrum of materials ranging from photovoltaics to battery materials and (non-)metallic glasses. These methods are also offered to materials researchers at universities and research institutes as well as in industry.