Department Microstructure and Residual Stress Analysis
Department
The activities in the department of microstructure and residual stress analysis aim at the characterization of structure and properties of matter across different length scales, ranging from nano- to macroscopic dimensions. The in-house research focuses on the development and enhancement of laboratory-based X-ray diffraction and scattering methods for nano- and microstructure, residual stress and texture analysis as well as their use in time- and spatially-resolved in- and ex-situ investigations and application to a broad spectrum of materials ranging from photovoltaics to battery materials and (non-)metallic glasses. These methods are also offered to materials researchers at universities and research institutes as well as in industry.
