Reflectometry for the investigation of X-ray optics

Mirrors, grids and crystals are the basis for soft X-ray optics and technology. At HZB, we routinely measure the quality of optical beamline elements, the reflectivity of mirrors, the efficiency of gratings, and the scattering properties of ultra-smooth surfaces. Our UHV reflectometer is a multi-purpose tool for determining the optical properties of samples in transmission or reflection. The reflectance can be determined at a fixed photon energy as a function of the angle of incidence or, conversely, as a function of the energy for a particular angle of incidence. The samples can have any size from a few square millimeters to macroscopic optical elements.