IT Hard- and software
Expertise by research divisions
Hard- and software know how by research divisions
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IT Hard- and software | ||||||||
Solar energy |
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Crystalline silicon solar cells | RD | D | ILA | ||||||
Thin-film solar cells (perovskite, CIGS, silicon) | |||||||||
Tandem solar cells (perovskite CIGS, perovskite silicon, silicon silicon) | RD | D | ILA | ||||||
Solar module technology | |||||||||
Building-integrated photovoltaics (BIPV) | |||||||||
Chemical energy conversion and storage |
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Solar hydrogen production | |||||||||
Conversion of carbon dioxide | |||||||||
Battery systems (lithium, metal-sulphur) | |||||||||
Electrodes (metal oxides, silicon) | |||||||||
Catalysts (metal oxides) | |||||||||
Quantum and Functional Materials |
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Control of spin-based phenomena (spintronics) | |||||||||
Control of collective states (quantum magnets, supercond., ferroelectrics) | |||||||||
Topological insulators | |||||||||
Nanomagnetic systems | |||||||||
Multiferroic materials | |||||||||
Application of photons for research and development |
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Understanding and controlling how materials work | D | ILA | |||||||
Chemical reactions at the atomic level | |||||||||
Phase transitions and switching processes | |||||||||
Optimising the conversion of light into energy | |||||||||
Optimisation of biochemical processes | |||||||||
Scientific services and key components |
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Synchrotron beamlines and sample environments | RD | D | ILA | ||||||
Superconducting cavities and electron guns | RD | D | ILA | ||||||
Precision diffraction gratings and x-ray optics | RD | D | ILA | ||||||
Undulators | RD | D | ILA | ||||||
Proton and gamma irradiation sources for radiation hardness tests |
Hard- and software research examples
- Irradiation tests on electronic components
- Tomography of coatings
- new materials for data storage
- Spintronics, spin structures
- topological insulators, nanomagnetic systems, multiferroic materials, quantum magnetism
- Characterisation of printed circuit boards and electronic components
- residual stress, microstructure and profile analysis of thin films and layer lattice semiconductors