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Institute Silicon Photovoltaics

NUV photoelectron spectroscopy

Photoelectron spectroscopy (PES) makes use of the external photoeffect to investigate the structure and electronic properties of materials.

Investigated materials

  • amorphous an nanocrystalline silicon
  • SiOx /SiO2
  • transparent conductive oxides: ITO, ZnO, WOx, InWOx, ...
  • organic semiconductor thin films, e.g. PEDOT:PSS

Selected References

L. Korte & M. Schmidt, J. Appl. Phys. 109 (2011) 063714-1-6.
L. Korte & M. Schmidt, J. Non-Cryst. Sol. 354 (2008) 2138-43.
L. Korte;  A. Laades & M. Schmidt, J. Non-Cryst. Sol. 352 (2006) 1217-20.
M. Schmidt; A. Schoepke; L. Korte; O.  Milch & W. Fuhs, J. Non-Cryst. Sol. 338-340 (2004) 211-214
B. Johnson; L. Korte; T. Lussky; J. Klaer & I. Lauermann, J. Appl. Phys. 106 (2009) 073712-6.
T.F. Schulze; L. Korte; F. Ruske & B. Rech, Phys. Rev. B 83 (2011) 165314.
M. Liebhaber; M. Mews; T.F. Schulze; L. Korte; B. Rech & K. Lips, Appl. Phys. Lett. 106 (2015) 031601.
M. Mews; L. Korte & B. Rech, Sol. En. Mat. and Sol. C. 158 (2016) 77-8