Institute Methods and Instrumentation for Synchrotron Radiation Research

Materials Functionality with meV Resonant Inelastic X-ray Scattering meVRIXS

The simultaneous detection of electronic structure properties and low energy excitation in functional materials is the reason why resonant inelastic X-ray scattering (RIXS) techniques have developed into powerful tools. With meVRIXS we created a meV high resolution instrumentation utilizing the to date underexplored very soft XUV energy range that is unique worldwide. meVRIXS thus allows for highest spectral resolution at the Brillouin zone center of solids. In particular rare earth materials and transition metals are accessible, as are low Z elements. As a complement the mobile solidflexRIXS experiment accesses the deeper soft X-ray core level information.

Figures: When illuminated by the synchrotron light, materials emit x-rays themselves due to the decay of valence electrons. In the case of magnetic materials like nickel, iron-nickel alloys and gadolinium, the number of emitted photons reduces when increasing the temperature due to electron-phonon scattering driven spin-flip in the valence band.