Department Optics and Beamlines
NAP-LEEM-XPEEM
A near ambient pressure NAP-LEEM/XPEEM instrument would round off the operando instrument portfolio at BESSY II. As part of the CatLab activities, the MPG has purchased a NAP-LEEM/XPEEM instrument, which combines electron microscopy with a lateral resolution between 8 and 30 nm with photoemission spectroscopy (< 60 meV energy resolution) as an operando tool, focusing on surface reactions in the mbar range at temperatures up to 800°C.
Uniqueness: Combining this instrument with a tunable soft X-ray source would create a worldwide unparalleled instrument. Accommodating it next to SMART and SPEEM would create a complementary spectromicroscopy analysis section for magnetism (SPEEM), high resolution studies of chemically relevant surfaces (SMART) and operando NAP reactions.
To avoid an energy distribution across the image and to keep the image size while changing energy resolution the beamline has a "isochromatic" design. The refocussing optic will not image the dispersion slit as usual but the plane grating.
© 04/25 S.H.