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Department Optics and Beamlines

NAP-LEEM-XPEEM

A near ambient pressure NAP-LEEM/XPEEM instrument would round off the operando instrument portfolio at BESSY II. As part of the CatLab activities, the MPG has purchased a NAP-LEEM/XPEEM instrument, which combines electron microscopy with a lateral resolution between 8 and 30 nm with photoemission spectroscopy (< 60 meV energy resolution) as an operando tool, focusing on surface reactions in the mbar range at temperatures up to 800°C.
Uniqueness: Combining this instrument with a tunable soft X-ray source would create a worldwide unparalleled instrument. Accommodating it next to SMART and SPEEM would create a complementary spectromicroscopy analysis section for magnetism (SPEEM), high resolution studies of chemically relevant surfaces (SMART) and operando NAP reactions.

enlarged view

New NAP-LEEM-XPEEM beamline next to SMART and SPEEM.

To avoid an energy distribution across the image and to keep the image size while changing energy resolution the beamline has a "isochromatic" design. The refocussing optic will not image the dispersion slit as usual but the plane grating.

enlarged view

Side and Topview of the upcoming beamline.

© 04/25 S.H.