Expertise

Radiography | Tomography | Transmission Electron Microscopy

Residual stress analysis utilizing X-ray & neutron diffraction | Reflectometry für Invenstigation Thin Films and Interfaces | Characterization of Polymers using Small-Angle Scattering

EXAFS & XANES for characterising cathode materials | Thermoelectric Materials (RIXS) | Optimisation of Material Surfaces using XPS

Gamma irradiation | Magnetization, Conductivity & Polarization | SupraLab (superconducting radio-frequency systems and cryogenic applications)

Crystal Growth & Sample Preparation | Processing & Production of Optical Components

BIPV - Building-integrated Photovoltaics

CoreLabs – Multi-user platforms for science and industry