Abou-Ras, D.; Harvey, S.: Chapter 15 : "Summary and Outlook". In: Mowafak Al-Jassim; Nancy Haegel [Eds.] : Advanced Characterization of Thin Film Solar CellsLondon: The Institution of Engineering and Technology, 2020 (IET power and energy series ; 166). - ISBN 978-1-83953-023-4, p. 427–430
10.1049/PBPO166E
Abstract:
In the various chapters of this book, numerous characterization techniques are presented that can be applied to thin-film solar cells to determine (micro)structural, compositional, electrical, and optoelectronic properties. What has yet to be more fully elucidated is to what extent these characterization techniques can be combined, in a correlative way, to enhance the information gathered on materials and devices. Indeed, it is valuable to consider combining techniques to verify the relevance of the measured materials properties or to obtain them on different length scales-to compare surface with bulk properties, or to correlate structure and composition of materials with electrical and optoelectronic properties.