• 
  Eckert, S.; Beye, M.; Pietzsch, A.; Quevedo, W.; Hantschmann, M.; Ochmann, M.; Ross, M.; Minitti, M. P.; Turner, J. J.; Moeller, S. P.; Schlotter, W. F.; Dakovski, G. L.; Khalil, M.; Huse, N.; Föhlisch, A.: Principles of femtosecond X-ray/optical cross-correlation with X-ray induced transient optical reflectivity in solids. Applied Physics Letters 106 (2015), p. 061104/1-4

10.1063/1.4907949
Open Accesn Version