Bagschik, K.; Wagner, J.; Buß, R.; Riepp, M.; Philippi-Kobs, A.; Müller, L.; Buck, J.; Trinter, F.; Scholz, F.; Seltmann, J.; Hoesch, M.; Viefhaus, J.; Grübel, G.; Oepen, H.P.; Frömter, R.: Direct 2D spatial-coherence determination using the Fourier-analysis method: Multi-parameter characterization of the P04 beamline at PETRA III. Optics Express 28 (2020), p. 7282-7301
10.1364/oe.382608
Open Access Version
Abstract:
We present a systematic 2D spatial-coherence analysis of the soft-X-ray beamline P04 at PETRA III for various beamline configurations. The influence of two different beam-defining apertures on the spatial coherence properties of the beam is discussed and optimal conditions for coherence-based experiments are found. A significant degradation of the spatial coherence in the vertical direction has been measured and sources of this degradation are identified and discussed. The Fourier-analysis method, which gives fast and simple access to the 2D spatial coherence function of the X-ray beam, is used for the experiment. Here, we exploit the charge scattering of a disordered nanodot sample allowing the use of arbitrary X-ray photon energies with this method.