Cierpka, A.; Keckert, S.; Kramer, F.; Kugeler, O.; Knobloch, J.: Analysis of Semiconductor Components as Temperature Sensors for Cryogenic Investigation of SRF Materials. In: Kenji Saito ... [Ed.] : SRF2023 : Proceedings of the 21st International Conference on RF Superconductivity, Grand Rapids, MichiganGeneve: JACoW, 2023. - ISBN 978-3-95450-234-9, p. MOPMB010/80-83
https://srf2023.vrws.de/papers/mopmb010.pdf
10.18429/JACoW-SRF2023-MOPMB010
Open Access Version
Abstract:
Temperature mapping systems have been used for many years to detect local heating in an SRF cavity surface or materials sample. They require a large number of temperature sensors. Most often, low-cost Allen-Bradley resistors are used for this purpose. Since they have poor sensitivity and reproducibility above 4 K, sensor alternatives that combine the precision of Cernox1 sensors with the low-cost of AllenBradley resistors would be highly desirable. In this work various semiconductor components that exhibit a temperature dependent electrical response, such as diodes and LEDs were analyzed with respect to sensitivity, reproducibility and response speed in a temperature range between 6.5 K and 22 K. In this range, many diodes and LEDs were found to be more sensitive than Cernox sensors. However, in some components the response time was slow – possibly due to poor thermal contact.