KMC-2 XANES

XANES, EXAFS, myXANES, myEXAFS

The KMC-2 XANES is dedicated to investigate the short-range environment around selected atomic species in condensed matter by X-ray Absorption Spectroscopy. It provides linear polarized light at 4 – 15 keV photon energy for EXAFS, XANES and X-ray fluorescence measurements at-air. The detector system consists of three ionization chambers, Si-PIN photodiode, energy-dispersive detector (Bruker X-Flash 6|60) and scintillation counter. The experimental setup allows for a parallel monitoring of the X-ray beam intensity transmitted through the sample as well as fluorescence yield measurements.


Methods

myXRF, XRF, NEXAFS, EXAFS

Remote access

not possible

Beamline data
Energy range 4 - 15 keV
Energy resolution 1/4000
Flux dipole, 1e7 - 1e10
Polarisation linear horizontal
Focus size (hor. x vert.) 250 μm x 600 μm (4.8 μm x 4.8 μm with capillary optics; at XANES only, not available at Diffraction)
Phone +49 30 8062 14623
Weitere Details KMC-2
Station data
Temperature range 293 K
Pressure range For details contact the station manager.
Detector Bruker X-Flash 6|60, 3 ionization chambers, Si-PIN photodiodes
Manipulators Huber goniometer
Sample holder compatibility
  • Maximum sample size: unlimited
  • For details contact the station manager
Additional equipment
  • Microfocusing: > 5 μm
  • Micro-EXAFS, Micro-fluorescence: limited / no mapping
  • Beam intensity stabilization: MOSTAB electronics (accuracy 0.3%)
  • Control system: PC-based BESSY monochromator control system EMP/2
  • Data-acquisition computer: PC, measurement bus-extension, OS/2-operating system
  • Data acquisition software: Windows-NT, RADICON RDPW software


Instrument description

The KMC-2 XANES is a dedicated endstation to investigate the short-range environment around selected atomic species in condensed matter by X-ray Absorption Spectroscopy. This end-station provides possibility for EXAFS, XANES and X-ray fluorescence measurements at-air. The detector system consists of three ionization chambers, Si-PIN photodiode, energy-dispersive detector (Bruker X-Flash 6|60) and scintillation counter. The experimental setup allows for a parallel monitoring of the transmitted through the sample X-ray beam intensity as well as for fluorescence yield measurements. This end-station is permanently attached to the KMC-2 beamline providing medium photon flux between 4000 eV and 15000 eV and linear photon polarization, necessary to exploit the potential of X-ray absorption spectroscopy.

Instrument application

X-ray Absorption Spectroscopy (XAS) is a powerful structural technique to investigate the short-range environment around selected atomic species in condensed matter. While scanning the x-ray energy impinging onto the sample, a core level photoelectron is generated. This is scattered by the surroundings matter producing interference effects visible in the absorption cross-section and usually referred to as x-ray absorption fine structure (XAFS). The process itself is general and therefore fundamental to study structural properties in materials like:
•    liquids, molecular solutions, liquid crystals;
•    single- and poly-crystalline materials;
•    amorphous and highly disordered solids;
•    molecules and macromolecules containing metallic atoms or partially substituted with heavy atoms.
 
The energy range 4.0 keV < E < 15 keV is sufficient for K-edge studies of elements in the range 21 < Z < 36 and L-edge studies of elements in the range 49 < Z < 83. The sample thicknesses for experiments are in the µm range for transmission experiments. However, thin film and/or dilute systems studies are still possible in fluorescence mode.