SEM Zeiss Ultra
Rasterelektronenmikroskop
| Probenumgebung | |
|---|---|
| Probenbedingungen | Polished samples, must be made conductive e.g. with carbon |
| Was passiert mit der Probe? | high vacuum 10-9 bar, electronic beam heats the observed region and deposits carbon |
| Was kann man messen? | |
| Was kann man messen? | microstructure of metallic, ceramic, polymer and composite materials; backscatter electron contrast, EBSD, EDX |