• Soltwisch, V.; Herrero, A.F.; Pflueger, M.; Haase, A.; Probst, J.; Laubis, C.; Krumrey, M.; Scholze, F.: Reconstructing detailed line profiles of lamellar gratings from GISAXS patterns with a Maxwell solver. Journal of Applied Crystallography 50 (2017), p. 1524-1532

10.1107/S1600576717012742
Open Access Version