• Hages, C.J.; Redinger, A.; Levcenko, S.; Hempel, H.; Koeper, M.J.; Agrawal, R.; Greiner, D.; Kaufmann, C.A.; Unold, T.: Identifying the Real Minority Carrier Lifetime in Nonideal Semiconductors: A Case Study of Kesterite Materials. Advanced Energy Materials 7 (2017), p. 1700167/1-10

10.1002/aenm.201700167
Open Access Version (externer Anbieter)