PEAXIS
PhotoElectron Analysis and X-ray Inelastic Spectroscopy /U41
The instrument PEAXIS (PhotoElectron Analysis and X-ray Inelastic Spectroscopy) is located at the U41-PEAXIS beamline, which is one of the highest flux beamlines at BESSY II and provides highly focused soft X-rays, thanks to the ellipsoidal refocusing mirror. The instrument is dedicated to studies of angle-resolved RIXS (Resonant Inelastic X-ray Scattering) and PES (PhotoElectron Spectroscopy) on solids. As shown in the Schematic figure below, the station is equipped with an electron energy analyzer (violet) and a RIXS spectrometer (blue). Various sample manipulators (red) can be installed in the sample chamber (green). The RIXS arm is continuously rotatable on a supporting rail in a range of 106 degrees.
Anwendungsbeispiele:- Magnetic, d-d and charge transfer excitations in model quantum materials and functional energy materials
- Dispersive excitations in quantum materials (e.g. plasmons and excitons)
- Electron-phonon coupling in solid-state materials
- Reaction mechanisms in battery materials
Methods
ARPES, XPS, RIXS, EXAFS, NEXAFS
Remote access
depends on experiment - please discuss with Instrument Scientist
Instrument data | |
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Phone (~49 30 8062-) | 13154 |
Beam availability | 12h/d |
Source | U41 (Undulator) |
Monochromator | 800 l/mm PGM |
Energy range (at experiment) | 180 eV - 1600 eV (RIXS: 200 eV - 1200 eV) |
Energy resolution | E/ΔE@400 eV: 6500 to 14000 E/ΔE@867 eV: 5500 to 12500 (depending on setup) |
Flux | photons (s-1 (250 mA ring current)-1) at sample: @400 eV: 1.4*1012 to 2.4*1011 @900 eV: 4.6*1011 to 7.7*1010 (depending on setup) |
Polarisation | horizontal |
Focus size (hor. x vert.) | 15 µm x 4 µm |
Temperature range | 20 ~ 1000 K |
Pressure range | 10-8 ~ 10-9 mbar |
Detector | A hemispherical energy analyzer (SPECS PHOIBOS 150) for electron detections; a CCD camera (Andor iKon-L) for X-ray detections; two mass spectrometers for mass detections in the loadlock and sample chamber, respectively; two ammeter (Keithley 6517B) for sample drain current and photodiode measurements |
Manipulators | Two solid sample manipulators with full translational and rotational movements along XYZ axes covering two temperature ranges of 20 K ~ RT and LN ~ 1000 K |
Sample holder compatibility | less than 1 x 1 cm2 |
Additional equipment | |
Additional information | Details beamline U41_PGM
RIXS grating: Two VLS gratings of 2400 l/mm covering two energy ranges of 200 - 600 eV and 400 - 1200 eV Sample treatment: Ar sputtering and annealing up to 800 K, mechanical cleaving tool |