BAMline Spectroscopy
Nondestructive testing in analytical chemistry
The BAMline is a hard X-ray beamline at BESSY-II installed at a 7T wavelength shifter (WLS). It features two monochromator optics, which allow primary X-ray spectrsocopy applications to operate in the 5-40 keV energy range.
Under the motto "Materials Chemistry Characterization and Testing", BAMline Spectroscopy offers versatile X-ray spectroscopy methods and applications.
A detailed overview of the X-ray spectroscopy methods available at the BAMline can be found here.
Anwendungsbeispiele:- Measuring the elemental distributions in biological samples
- Determination of degradation processes
- Operando electrocatalysis
- Time-resolved in situ studies
- Formation mechanisms during various synthetic routes
Methods
EXAFS, NEXAFS, XRF, XRF Mapping, XRF, XRF Mapping
Remote access
depends on experiment - please discuss with Instrument Scientist
| Beamline data | |
|---|---|
| Energy range | 4.5 keV - 60 keV |
| Energy resolution |
|
| Flux |
|
| Polarisation | horizontal |
| Focus size (hor. x vert.) | DMM: vert. 0.15 mm between 35 m and 45 m from source; DCM: hor. 0.25 mm at 37 m from source |
| Phone | +49 30 8104 5576 |
| Weitere Details | BAMline |
| Station data | |
| Temperature range | room temperature |
| Pressure range | ambient |
| Detector | Color X-Ray Camera pnCCD, e2V Si-Li, Bruker X-Flash, CCD, 4 elements SDD, optical microscope, sCMOS |
| Manipulators | |
| Sample holder compatibility | |
| Additional equipment | Optical microscope for alignment purposes; microscopy images can be saved at every measurement coordinate for correlation of measured data and microscopy |
The beamline offers comprehensive X-ray spectroscopy capabilities, including X-ray Absorption Spectroscopy (XAS) and X-ray Fluorescence Spectroscopy (XRF) both in multiple operational modes, listed bellow:
Method | Time resolution | Spatial resolution | Detectors
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Continuous-XAS 10 s for EXAFS 1.5 µm - 10 mm 3 Ionisation chambers
(tranmission & (IC Spec from FBM-Oxford)
fluorescence 4-Element-SDD
simultaneously) (from LLA-Instruments)
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Dispersive-XAS 1 s 20 µm Pco.4000 edge CCD camera
(4008 x 2672 pixels)
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Micro-XRF/XAS up to 200 pts/s 1 µm Adjustable focus with
compund refractive lens
(CRL)
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Mapping Sheet-like beam 2 x 8 x 8 µm3 pnCCD area&energy
(Slicing-XRF) 10 min /layer sensitive detector
(264x264 single SDDs
each 48x48µm2,
total of 12.8 x 12.8 mm2)
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crystal analysators:
Si(1111), LiF(220),
LiF(200)
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Coded aperture 15 min 100 µm Lens-less imaging
XRF with multipinhole apertures
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Sample environments:
Different scanning environments for different sample sizes (from several micrometer to 150mm) are available at the beamline. Rotational units are available as well. It is possible to mount sample environments or reactors in the experimental hutch. Temperature in experimental hutch is controlled.
Following sample environments are available:
- Specialized setup for electrocatalysis suitable for XAS in transmission and fluorescence modii;
- Equipment for monitoring chemical synthesis processes in real-time, with the possibility to stir and heating stage up to 200 °C. Inner volume of 15 mL;
- Cell for solutions in flow or static with thickness between 1.5 and 6 mm, with volumes between 0.4 – 1.7 mL;
- Hole plate with thickness between 1 and 3 mm, can accommodate powders diluted with Boron Nitride or PE or cellulose, or pressed pellets.
Available gases:
Standard gases include N₂, Ar, Kr, and Xe, with additional options for CO₂, O₂, and CH₄ upon request.
Contact:
For more information, please contact martin.radtke@bam.de (XRF, XAS), or ana.buzanich@bam.de (XAS).