XUV Diffractometer

XUV Diffractometer for Resonant Soft X-Ray Scattering

The XUV Diffractometer is dedicated to explore electronic ordering phenomena, like magnetic, charge and orbital ordering by resonant soft x-ray scattering experiments. This versatile instrument is a UHV-compatible two-circle diffractometer operating in horizontal scattering geometry with the sample and detector rotations driven from outside vacuum by Huber circles with highest accuracy and stability. It can perform high quality diffraction experiments even from tiny crystals (<100μm x 100μm) over a large angular range as well as specular reflectivity measurements with very high accuracy.

Anwendungsbeispiele:

Diffraction from complex electronic ordering phenomena (magnetic, charge and orbital order)
Interfacial electronic properties in heterostructures
Magnetic structure determination from tiny single crystals and nanostructures
Magnetization depth profiles

$High-Field and XUV Diffractometer at the UE46 PGM-1 beamline.$

High-Field and XUV Diffractometer at the UE46 PGM-1 beamline.

Methods

Magnetic Scattering, Reflectivity, REXS, Elastic Scattering, Reflectometry

Remote access

depends on experiment - please discuss with Instrument Scientist

Beamline data
Energy range	120 - 2000 eV
Energy resolution	10 000
Flux	10¹²
Polarisation	linear any angle (with restrictions) circular
Focus size (hor. x vert.)	focussed beam: typically 100 µm x 50 µm ultimate 40 µm x 10 µm collimated beam: ≤ 1.7 mm x 1.5 mm (depending on apertures)
Phone	+49 30 8062 14717
Weitere Details	UE46_PGM-1
Station data
Temperature range	3.8 - 320 K ( for T = 3.0 K contact Instrument Scientists)
Pressure range	10^-9 mbar
Detector	AXUV100 type photodiode; Drain current
Manipulators	x/y/z; phi (manual)
Sample holder compatibility	Scattering geometry: horizontal Angular range: unlimited (360 deg.) Software: SPEC Azimuthal sample rotation: yes Maximum sample size: 5 mm x 5 mm For more options contact the Instrument Scientists.
Additional equipment	User equipment for in-situ applications can be accommodated: strain cell, four-probe resistivity, sample current, etc.

The XUV Diffractometer is a dedicated endstation to explore electronic ordering phenomena, like magnetic, charge and orbital ordering by resonant soft x-ray scattering (RSXS) experiments. This versatile endstation is a UHV-compatible two-circle diffractometer operating in horizontal scattering geometry with the sample and detector rotations driven from outside vacuum by Huber circles with highest accuracy and stability. It allows to perform high quality diffraction experiments even from tiny crystals (< 100μm x 100μm) over a large angular range as well as measurements of specular reflectivity with very high accuracy. With the samples mounted directly to a LHe-flow-cryostat, sample temperatures below 4 K can be reached. Azimuthal rotation in situ is provided for azimuth-dependent measurements. Photons are detected by an AXUV100-type photodiode with a set of changeable slits in front for optimizing the q-resolution. The detector can be scanned in the direction perpendicular to the scattering plane. This allows to compensate possible Chi-misalignment without compromising about the lowest sample temperatures. The experimental setup allows for x-ray absorption (XAS) masurements by parallel monitoring of the sample drain current (TEY measurements) as well as for FY measurements. The instrument is flexible and can adapt to special sample mounting. The endstation is permanently attached to the UE46_PGM-1 beamline providing high photon flux between 120eV and 2000 eV and variable photon polarization. The beamline also hosts the High-Field Diffractometer, an instrument for RSXS and XAS studies in magnetic fields up to 7 Tesla. Both instruments can be used within the same beam time. Beamline and instruments are operated by the Institute Quantum Phenomena in Novel Materials at HZB.

Selected Publications

Bluschke, M.; Frano, A.; Schierle, E.; Minola, M.; Hepting, M.; Christiani, G.; Logvenov, G.; Weschke, E.; Benckiser, E.; Keimer, B.: Transfer of Magnetic Order and Anisotropy through Epitaxial Integration of 3d and 4f Spin Systems. Physical Review Letters 118 (2017), p. 207203/1-5

Hamann-Borrero, J.E.; Macke, S.; Gray, B.; Kareev, M.; Schierle, E.; Partzsch, S.; Zwiebler, M.; Treske, U.; Koitzsch, A.; Büchner, B.; Freeland, J.W.; Chakhalian, J.; Geck, J.: Site-selective spectroscopy with depth resolution using resonant x-ray reflectometry. Scientific Reports 7 (2017), p. 13792/1-11

Gyenis, A.; da Silva Neto, E.H.; Sutarto, R.; Schierle, E.; He, F.; Weschke, E.; Kavai, M.; Baumbach, R.E.; Thompson, J.D.; Bauer, E.D.; Fisk, Z.; Damascelli, A.; Yazdani, A.; Aynajian, P.: Quasi-particle interference of heavy fermions in resonant x-ray scattering. Science Advances 2 (2016), p. e1601086/1-7

Frano, A.; Blanco-Canosa, S.; Schierle, E.; Lu, Y.; Wu, M.; Bluschke, M.; Minola, M.; Christiani, G.; Habermeier, H.U.; Logvenov, G.; Wang, Y.; van Aken, P.A.; Benckiser, E.; Weschke, E.; Le Tacon, M.; Keimer, B.: Long-range charge-density-wave proximity effect at cuprate/manganate interfaces. Nature Materials 15 (2016), p. 831-835

da Silva Neto, E.H.; Aynajian, P.; Frano, A.; Comin, R.; Schierle, E.; Weschke, E.; Gyenis, A.; Wen, J.; Schneeloch, J.; Xu, Z.; Ono, S.; Gu, G.; Le Tacon, M.; Yazdani, A.: Ubiquitous Interplay Between Charge Ordering and High-Temperature Superconductivity in Cuprates. Science 343 (2014), p. 393-396

Fink, J.; Schierle, E.; Weschke, E.; Geck, J.: Resonant elastic soft x-ray scattering. Reports on Progress in Physics 76 (2013), p. 056502/1-59

Ghiringhelli, G.; Le Tacon, M.; Minola, M.; Blanco-Canosa, S.; Mazzoli, C.; Brookes, N.B.; De Luca, G.M.; Frano, A.; Hawthorn, D.G.; He, F.; Loew, T.; Sala, M.M.; Peets, D.C.; Salluzzo, M.; Schierle, E.; Sutarto, R.; Sawatzky, G.A.; Weschke, E.; Keimer, B.; Braicovich, L.: Long-Range Incommensurate Charge Fluctuations in (Y,Nd)Ba₂Cu₃O_6+x. Science 337 (2012), p. 821-825

XUV Diffractometer