Decker, R.; Born, A.; Büchner, R.; Ruotsalainen, K.; Stråhlman, C.; Neppl, S.; Haverkamp, R.; Pietzsch, A.; Föhlisch, A.: Measuring the atomic spin-flip scattering rate by x-ray emission spectroscopy. Scientific Reports 9 (2019), p. 8977/1-6
10.1038/s41598-019-45242-8
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