Publikationen 2017
Braig, C.; Sokolov, A.; Wilks, R.; Kozina, X.; Kunze, T.; Bjeoumikhova, S.; Thiel, M.; Erko, A.; Bär, M.:
Polycapillary-boosted instrument performance in the extreme ultraviolet regime for inverse photoemission spectroscopy. Optics Express 25 (2017), p. 31840-31852
doi: 10.1364/OE.25.031840
Open Access
Chkhalo, N.I.; Gusev, S.A.; Nechay, A.N.; Pariev, D.E.; Polkovnikov, V.N.; Salashchenko, N.N.; Schäfers, F.; Sertsu, M.G.; Sokolov, A.; Svechnikov, M.V.; Tatarsky, D.A.:
High-reflection Mo/Be/Si multilayers for EUV lithography. Optics Letters 42 (2017), p. 5070-5073
doi: 10.1364/OL.42.005070
Eggenstein, F.; Krivenkov, M.; Rudolph, I.; Sertsu, M.G.; Sokolov, A.; Varykhalov, A.; Wolf, J.; Zeschke, Th.; Schäfers, F.:
Investigation of HF-plasma-treated soft x-ray optical elements. In: Lahsen Assoufid ... [Ed.] : Advances in Metrology for X-Ray and EUV Optics VIIBellingham, Washington: SPIE, 2017 (Proceedings of SPIE ; 10385). - ISBN 978-1-51061-227-3, p. 10385-1-7
doi: 10.1117/12.2272967
Groitl, F.; Toft-Petersen, R.; Quintero-Castro, D.; Meng, S.; Lu, Z.; Huesges, Z.; Le, M.D.; Alimov, S.; Wilpert, T.; Kiefer, K.; Gerischer, S.; Bertin, A.; Habicht, K.:
MultiFLEXX - The new multi-analyzer at the cold triple-axis spectrometer FLEXX. Scientific Reports 7 (2017), p. 13637/1-12
doi: 10.1038/s41598-017-14046-z
Open Access
Herrero, A.; Pflüger, M.; Probst, J.; Scholze, F.; Soltwisch, V.:
Characteristic diffuse scattering from distinct line roughnesses. Journal of Applied Crystallography 50 (2017), p. 1766-1772
doi: 10.1107/S1600576717014455
Open Access (external provider)
Kozhevnikov, I.V.; Buzmakov, A.V.; Siewert, F.; Tiedtke, K.; Störmer, M.; Samoylova, L.; Sinn, H.:
Growth of nano-dots on the grazing incidence mirror surface under FEL irradiation: Analytic approach to modeling. In: Libor Juha ... [Ed.] : Damage to VUV, EUV, and X-ray Optics VI : 24-25 April 2017, Prague, Czech RepublicSPIE, 2017 (Proceedings of SPIE ; 10236). - ISBN 978-1-5106-0973-0, p. 102360D/1-7
doi: 10.1117/12.2269371
Open Access
Pflueger, M.; Soltwisch, V.; Probst, J.; Scholze, F.; Krumrey, M.:
Grazing-incidence small-angle X-ray scattering (GISAXS) on small periodic targets using large beams. IUCrJ 4 (2017), p. 431-438
doi: 10.1107/S2052252517006297
Open Access
Roling, S.; Kärcher, V.; Samoylova, L.; Appel, K.; Braun, S.; Gawlitza, P.; Siewert, F.; Zastrau, U.; Rollnik, M.; Wahlert, F.; Zacharias, H.:
A hard x-ray split-and-delay unit for the HED Instrument at the European XFEL. In: Thomas Tschentscher ; Luc Patthey [Eds.] : Advances in X-ray Free-Electron Lasers Instrumentation IV : 25-27 April 2017, Prague, Czech RepublicBellingham, Washington, USA: SPIE, 2017 (Proceedings of SPIE ; 10237). - ISBN 978-1-5106-0975-4, p. 1023713/1-8
doi: 10.1117/12.2265750
Open Access
Soltwisch, V.; Herrero, A.F.; Pflueger, M.; Haase, A.; Probst, J.; Laubis, C.; Krumrey, M.; Scholze, F.:
Reconstructing detailed line profiles of lamellar gratings from GISAXS patterns with a Maxwell solver. Journal of Applied Crystallography 50 (2017), p. 1524-1532
doi: 10.1107/S1600576717012742
Open Access
Wurm, M.; Endres, J.; Probst, J.; Schoengen, M.; Diener, A.; Bodermann, B.:
Metrology of nanoscale grating structures by UV scatterometry. Optics Express 25 (2017), p. 2460-2468
doi: 10.1364/OE.25.002460
Xavier, J.; Probst, J.; Becker, Ch.:
Nanoimprinted deterministic aperiodic nanostructures for tailored light matter interactions. In: European Physical Society [Ed.] : 2017 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO Europe-EQEC) : 25-29 June 2017Piscataway, NJ: IEEE, 2017. - ISBN 978-1-5090-6736-7, p. 855