• 
  Filatova, E.O.; Kozhevnikov, I.V.; Sokolov, A.A.; Yegorova, Yu.V.; Konashuk, A.S.; Vilkov, O.Yu; Schaefers, F.; Gorgoi, M.; Shulakov, A.S.: X-ray and photoelectron spectroscopic nondestructive methods for thin films and interfaces study. Application to SrTiO₃ based heterostuctures. Microelectronic Engineering 109 (2013), p. 13-16

10.1016/j.mee.2013.03.095