Wippler, D.; Wilks, R.G.; Pieters, B.E.; van Albada, S.J.; Gerlach, D.; Huepkes, J.; Baer, M.; Rau, U.: Pronounced Surface Band Bending of Thin-Film Silicon Revealed by Modeling Core Levels Probed with Hard X-rays. ACS Applied Materials & Interfaces 8 (2016), p. 17685-17693
10.1021/acsami.6b04666