Wimmer, M.; Bär, M.; Gerlach, D.; Wilks, R.G.; Scherf, S.; Lupulescu, C.; Ruske, F.; Felix, R.; Hüpkes, J.; Gavrila, G.; Gorgoi, M.; Lips, K.; Eberhardt, W.; Rech, B.: Hard x-ray photoelectron spectroscopy study of the buried Si/ZnO thin-film solar cell interface: Direct evidence for the formation of Si-O at the expense of Zn-O bonds. Applied Physics Letters 99 (2011), p. 152104/1-3
10.1063/1.3644084
Open Access Version (externer Anbieter)