Marongiu, M.; Schälicke, A.; Kalus, C.; Rehm, G.; Ries, M.; Dürr, V.: Direct X-Ray imaging for the new pinhole diagnostics at BESSY II. In: Narender Kumar ... [Ed.] : Proceedings of the 14th International Beam Instrumentation Conference, IBIC 2025 : from 7 to 11 September 2025 at University of LiverpoolGeneve: JACoW, 2025. - ISBN 978-3-95450-262-2, p. TUPCO25/416-419
10.18429/JACoW-IBIC2025-TUPCO25
Open Access Version
Abstract:
In order to improve our transverse diagnostic tools, two new pinhole beamlines will be designed. The pinhole arrays will be in air for easier maintenance: this will result in a significant loss of X-Ray photons when passing through the vacuum window. To overcome this issue, the option to directly illuminate a CCD/CMOS camera with X-Ray radiation without prior conversion into visible light is under study. Tests in the existing beamline both with a conventional CMOS camera and with a dedicated X-Ray camera are foreseen. This report describes our findings regarding the current status regarding the use of X-Ray cameras as a ”high flux” diagnostic tool, as well as our preliminary experimental results.