PSM
Potential-Seebeck-Microprobe / PSMII
For studying samples which show an inhomogeneous sample composition, spatially resolved measurements of the electrical conductivity σ and the Seebeck coefficient S are of special interest. In our laboratory a Potential-Seebeck-Microprobe PSMII (PANCO GmbH) is available which measures S and σ of a sample surface spatially resolved with a resolution of up to 5 μm.
| Spezifikation | |
|---|---|
| Temperature | room temperature |
| Scanning area | max. 100 mm x 100 mm |
| Local resolution | up to 5 μm |
| Position accuracy | 0.05 μm unidirectional, 1 μm bidirectional |
| Signal resolution | 100 nV |
| Measurement range | 100 S/cm...10000 S/cm |
| Uncertainty of S | ±3% for semiconductors, ±5% for metals |
| Uncertainty of σ | ±4% |
| Reproducibility of S | ±3% |
| Reproducibility of σ | ±3% |