Posters
IWXM Poster Sessions
| Author | Subject | Title |
| Jiatai Feng | Spectrometer | Soft/tender X-ray 2D-RIXS Spectrometer Design |
| Matthias Müller | Beamlines | Tender X-ray Microfocus Beamline for Dipole Radiation at BESSY II |
| Nazanin Samadi | Beamlines | X-ray Optics and Instrumentation Testing at P25: Enabling Multifunctional Developments towards PETRA IV |
| Peter Baumgärtel | Beamlines / Software | New Out-of-the-box Synchrotron Radiation Source in RAY-UI |
| Peter Baumgärtel | Beamlines / Software | RAYX: A Next Generation Tool for Simulating and Designing Beamlines |
| Timm Waterstradt | Fabrication / Bender | Mechanical Benders for Sub-100-nrad Mirrors |
| Maurizio Vannoni | Metrology Optics Bender | SXP Bendable Mirrors Substrates Characterisation |
| Katherine Morrow | Optics/Software | Modelling the Temporal Effects of Multilayer Structures in Python Using the Transfer Matrix Method |
| François Perrin | Metrology/Software | PyLOSt – a Software Package for Sub-aperture Stitching and Data Analysis of Metrology Data of Reflective X-ray Optics |
| Albert Van Eeckhout | Metrology | Improving Fizeau Stitching Measurements with a Fan |
| Théo Sieg-Letessier | Metrology | Long Trace Profiler Downwards and Sideways Facing Measurement Simulations |
| Josep Nicolas | Metrology | Fast Mirror Metrology with the ALBA-NOM |
| Cyprian Wozniak | Metrology | TITAN: Plug and Play Stitching Topography at Nanoscale |
| Valeriy Yashchuk | Metrology | Development of Super-Resolution Interference Microscopy Metrology of X-ray VLS Diffraction Gratings |
| Raymond Barret | Metrology | Superflat – an Initiative for Improved Flat Mirror Quality |
| Dongni Zhang | Metrology | Optical Metrology of the High Energy Photon Source |
| Fang Liu | Metrology | Newly Developed Wavefront Metrology Techniques and Application of HEPS |
| Barbara Keitel | Metrology/Beamline/InSitu | New Wavefront Sensor for Renewed Differential Pumping Unit at FLASH2 Beamlines |
| Mikako Makita | Metrology/Beamline/InSitu | Near-field Probing Potentials Using Ronchi Method and Hard X-ray FEL Pulses |
| Ohashi Haruhiko | Metrology/Beamline/InSitu | Experimental Correction of Wavefront Distortion Recorded by Talbot Interferometer with Mismatched Gratings |
| Hiroki Nakamori | Metrology/Fabrication | Development of Stitching CGH Interferometry for Manufacturing 2-Dimensionally Curved X-ray Mirrors |
| Simon Aclock | Metrology/Tools | An Ultra-stable, 3-axis Goniometer for Precise Angular Positioning for Optical Metrology of X-ray Mirrors |
| Albert Van Eeckhout | Metrology/Astro | MINERVA Positioning System with Bayesian Orientation Control for Assembling the NewATHENA Mission Mirror Modules |
| Amparo Vivo | Metrology/Fabrication/Coating | Optical Metrology for Differential Deposition at ESRF |
| Idoia Freijo Martin | Metrology/Optics/InSitu | Metrology Measurements of Mounted Mirrors for EuXFEL HED Split and Delay Unit |
| Jonathan Weck | Metrology/Optics/InSitu | At-Wavelength Metrology Facility for EUV and XUV Optics, Modern Data Processing and Simulations |
| Jürgen Probst | Optics | Light Element Analysis with the Parallel Wavelength-Dispersive Spectrometer “WDSX-300” |
| Christoph Braig | Optics | A Reflection Zone Plate for Parallelized High-Resolution X-ray Spectroscopy at the Fe L3-edge |
| Thomas Krist | Optics | Reflection Zone Plate Optics for Ultrafast Soft X-ray Absorption Spectroscopy in the Laboratory |
| Yasunori Senba | Optics | Standard Design and Evaluation of Monolithic Wolter Mirror for Hard X-ray Focusing at SPring-8 |
| Zhen Hong | Optics | The Research on the Fabrication of X-ray Optical Elements |
| Michael Krumey | Beamlines / Astro | Reflectance Measurements on Silicon Pore Optics for the NewAthena Observatory |
| Jason McLaurin | Spectrometer | High-Performance Ultrafast BroadbandTime-Resolved X-Ray-Absorption Spectrometer |
| Meiyi Wu | Optics | Correction on Gravity Compensation for a Bended Mirror |