Daniel Abou-Ras

At scales ranging from the centimeter to nanometer levels, obtaining information on:

- Local orientations and integral film texture

- Grain-size distributions

- Phase distributions

- Grain-boundary types from misorientations

- Grain-boundary plane distributions

Correlation of this information with electrical and optoelectronic properties of extended structural defects at microscopic levels.

Moreover, we have also successfully monitored phase segregation in halide-perovskite thin films by means of cathodoluminescence.