Program
Monday, 6th November
| 11:30 - 13:00 // Registration | ||
| 13:00 - 13:15 // Opening - Welcome - Dr. Markus Wollgarten & Dr. Katja Höflich | ||
| Session 1: Ion Matter Interaction and Material Modification | ||
| 13:15 - 14:00 | Plenary Talk: Fundamentals of Particle-Solid Interaction | Peter Sigmund (Syddansk Universite) |
| 14:00 - 14:15 | Moving up or down the wind: Ga+ beam-induced ripples on SiO2 can do both | Paul Alkemade (Kavli Institute of Nanoscience) |
| 14:15 - 14:30 | Focused ion beam technology for micro and nanoelectromechanical systems fabrication, prototyping and metrology | Teodor Gotszalk (Wroclaw University of Science and Technology) |
| 14:30 - 15:00 |
Invited Talk: Focused-ion beam milling of plasmonic nanostructures based on single-crystal gold platelets |
Bert Hecht (University Würzburg) |
| 15:00 - 15:30 // Coffee Break | ||
| Session 2: Analytics | ||
| 15:30 - 16:00 | Invited Talk: Analytic approaches with focused ion beams | Gregor Hlawacek (Helmholtz-Zentrum Dresden-Rossendorf) |
| 16:00 - 16:15 | NanoSpace: the new dual beam instrument allowing in-situ correlation of FIB-SEM-SIMS analysis | Jeremie Silvent (Orsay Physics) |
| 16:15 - 16:30 | Advances in FIB-SEM analytical tomography | Tobias Volkenandt (Carl Zeiss Microscopy GmbH) |
| 16:30 - 17:00 | Invited Talk: Secondary Ion Mass Spectrometry integrated on a FIBSEM instrument | Ivo Utke (EMPA) |
| 17:00 - 18:30 // Postersession | ||
| 18:30 // Transfer to Dinner Event | ||
| 19:00 - 22:30 // Dinner Event | ||
Tuesday, 7th November 2017
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Session 3: Novel Ion Beam Technolgies |
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| 9:00 - 9:15 |
Helium Ion Microscopy: High resolution Imaging and Nanomachining with He and Ne Ions |
Peter Gnauck (Carl Zeiss Microscopy GmbH) |
| 9:15 - 9:30 | Advanced FIB Nanofabrication with New Ion Species and Large Area Capabilities | Jörg Stodolka (Raith GmbH) |
| 9:30 - 9:45 | Ga-free sample preparation and reduced amorphization with Xe plasma FIB | Anna Prokhodtseva (Thermo Fischer Scientific) |
| 9:45 - 10:00 |
3D tomography of the SiAlON-graphene composite using Xe+ based dual beam system |
Hana Tesařová (TESCAN ORSAY Holding) |
| 10:00 - 11:00 // Coffee Break - Poster | ||
| Session 4: Advances in TEM Lamella Preparation | ||
| 11:00 - 11:15 | Beam Induced Polishing System and its Application on a Dual-Beam Microscope | Jin Huang (Dresden Center for Nanoanalysis) |
| 11:15 - 11:30 | AutoTEM 4: Advanced S/TEM sample preparation for everyone | Anna Prokhodtseva (Thermo Fischer Scientific) |
| 11:30 - 11:45 | Fast Laser Beam Preparation of Extended Cross-Sections for Solar Cell Diagnostics | Stephan Großer (Fraunhofer Center for Silicon Photovoltaics) |
| 11:45 - 13:15 // Lunch Break | ||
| 13:15 - 13:45 | Invited Talk: Correlative Microscopy with Light, Electrons and Ions in Environmental Microbiology | Matthias Schmidt (Helmholtz Centre for Environmental Research) |
| 13:45 - 14:00 | Exploiting Cryo-FIB/SEM to investigate the intracellular mineral formation in alga Emiliania huxleyi | Luca Bertinetti (Max Planck Institute of colloids and interfaces) |
| 14:00 - 14:15 | Analysis of Nascent Soot Particles from Flames by Helium Ion Microscopy | Daniel Emmrich (Bielefeld University) |
| 14:15 - 16:00 // Open Discussion | ||
| 16:00 - 18:00 // Lab Tour | ||