Hamann-Borrero, J.E.; Macke, S.; Gray, B.; Kareev, M.; Schierle, E.; Partzsch, S.; Zwiebler, M.; Treske, U.; Koitzsch, A.; Büchner, B.; Freeland, J.W.; Chakhalian, J.; Geck, J.: Site-selective spectroscopy with depth resolution using resonant x-ray reflectometry. Scientific Reports 7 (2017), p. 13792/1-11
10.1038/s41598-017-12642-7
Open Access Version
