Gloskovskii, A.; Jenkins, C.A.; Ouardi, S.; Balke, B.; Fecher, G.H.; Dai, X.-F.; Gruhn, T.; Johnson, B.; Lauermann, I.; Caballero, R.; Kaufmann, C.A.; Felser, C.: Hard x-ray photoelectron spectroscopy of chalcopyrite solar cell components. Applied Physics Letters 100 (2012), p. 092108/1-3
10.1063/1.3687197
Abstract:
Hard x-ray photoelectron spectroscopy is used to examine the partial density of states of Cu(In,Ga)Se2 (CIGSe), a semiconducting component of solar cells. The investigated, thin Cu(In,Ga)Se2 films were produced by multi-stage co-evaporation. Details of the measured core level and valence band spectra are compared to the calculated density of states. The semiconducting type electronic structure of Cu(In,Ga)Se2 is clearly resolved in the hard x-ray photoelectron spectra.