• del Prado, A.; San Andrés, E.; Mártil, I.; González-Díaz, G.; Kliefoth, K.; Füssel, W.: Annealing effects on the interface and insulator properties of plasma-deposited Al/SiOxNyHz/Si devices. Semiconductor Science and Technology 19 (2004), p. 133-141


Abstract:
Annealing Effects on the Interface and Insulator Properties of Plasma-Deposited Al/SiOxNyHz/Si Devices