Tikhonov, D.; Keckert, S.; Knobloch, J.; Kugeler, O.; Tamashevich, Y.; Valente-Feliciano, A.-M.: Superconducting Thin Films Characterization at HZB with the Quadrupole Resonator. In: Peter Michel ... [Ed.] : SRF2019, Proceedings of the 19th International Conference on RF Superconductivity, Dresden, GermanyGeneve: JacoW, 2019. - ISBN 978-3-95450-211-0, p. TUP073/618-622
Open Access Version
Abstract:
Superconducting thinfilms have great potential as post-Nb material for use in SRF applications in future accelerators and industry. Deposition of thinfilms on real cavities scales in test facilities are challenging,in particular when curved surfaces have to be coated. In this contribution we report on the method we use to characterize small and flat thinfilm samples (Deposited onto both Nb andCu substrates) in an actual cavity named the Quadrupole Resonator (QPR). We also summarize the latest measurement results of NbTiN thinfilms produced by J-Lab.