• 
  Platunov, M.S.; Varnakov, S.N.; Zharkov, S.M.; Bondarenko, G.V.; Weschke, E.; Schierle, E.; Ovchinnikov, S.G.: Analysis of the structure and magnetic properties of an interface in multilayered (Fe/Si)_N nanostructures with the surface-sensitive XMCD method. JETP Letters 99 (2014), p. 706-711

10.1134/S002136401412011X