Method: Reflection
Reflection of light at a surface is influenced by the surface properties of a sample. Hence, analyzing angular dependent intensity or polarization of reflected x-rays or IR light contributes to understanding the detailed surface properties of materials or thin films.
Please find below a list of reflection techniques used at BESSY II. Select one technique to get to a list of BESSY II instruments that employ it.
Acronnym | Long name |
---|---|
Ellipsometry | Ellipsometry |
Polarimetry | Polarimetry |
Reflectometry | Reflectometry |
XRF | X-ray Fluorescence |
XRF Mapping | X-ray Fluorescence Mapping |
Time-resolved reflection | Time-resolved reflection |