4 Bruker D8 Advance for thin film analysis (LMC)
Bruker D8 for thin film analysis
Bruker X-ray diffractometer for grazing incidence measurements. The instrument is equipped with a 9-fold sample changer.
» grazing incidence XRD with parallel beam
- depth-resolved thin film analysis
- 9-fold sample changer
Bruker D8 Göbel-Mirror for grazing incidence in PT006 Left: D8 equipped with X-ray (Goebel) mirror, 9-fold sample changer, and energy-dispersive Sol-X detector. Right: XRD pattern of an Al2O3 reference specimen.