Method: Crystallography (material sciences)
Crystallography (material sciences)
| Station | Energy Range | Polarisation | Beamline | Contact |
|---|---|---|---|---|
| KMC-2 Diffraction | 4000 - 15000 eV | linear horizontal | KMC-2 | Daniel Többens |
| MX-14-1 | 5000 - 15500 eV | horizontal | MX 14.1 | Manfred Weiss
Uwe Müller |
| MX-14-2 | 5000 - 15500 eV | horizontal | MX 14.2 | Manfred Weiss
Uwe Müller |