PEAXIS

Combined RIXS and XPS

The station PEAXIS (PhotoElectron Analysis and X-ray Inelastic Spectroscopy) is a fixed station installed at the U41-PEAXIS beamline. It is dedicated to studies of angle-resolved RIXS (Resonant Inelastic X-ray Scattering) and PES (PhotoElectron Spectroscopy) on solids. As shown in the Schematic figure below, the station is equipped with an electron energy analyzer (violet) and a RIXS spectrometer (blue). Various sample manipulators (red) can be installed in the sample chamber (green). The RIXS arm is continuously rotatable on a supporting rail in a range of 106 degrees.

Selected Applications:
  • Magnetic, d-d and charge transfer excitations in model quantum materials and functional energy materials
  • Dispersive excitations in quantum materials (e.g. plasmons and excitons)
  • Electron-phonon coupling in solid-state materials
  • Reaction mechanisms in battery materials
Schematic of the PEAXIS station

Schematic of the PEAXIS station


Methods

ARPES, XPS, RIXS, EXAFS, NEXAFS

Remote access

depends on experiment - please discuss with Instrument Scientist

Beamline data
Energy range 180 eV - 1600 eV (RIXS: 200 eV - 1200 eV)
Energy resolution E/ΔE@400 eV: 6500 to 14000
E/ΔE@867 eV: 5500 to 12500
(depending on setup)
Flux photons (s-1 (250 mA ring current)-1) at sample:
@400 eV: 1.4*1012 to 2.4*1011
@900 eV: 4.6*1011 to 7.7*1010
(depending on setup)
Polarisation horizontal
Focus size (hor. x vert.) 15 µm x 4 µm
Phone (030) 8062-13154
More details U41-PEAXIS
Station data
Temperature range 20 ~ 1000 K
Pressure range 10-8 ~ 10-9 mbar
Detector A hemispherical energy analyzer (SPECS PHOIBOS 150) for electron detections; a CCD camera (Andor iKon-L) for X-ray detections; two mass spectrometers for mass detections in the loadlock and sample chamber, respectively; two ammeter (Keithley 6517B) for sample drain current and photodiode measurements
Manipulators Two solid sample manipulators with full translational and rotational movements along XYZ axes covering two temperature ranges of 20 K ~ RT and LN ~ 1000 K
Sample holder compatibility less than 1 x 1 cm2
Additional equipment
RIXS gratings Two VLS gratings of 2400 l/mm covering two energy ranges of 200 - 600 eV and 400 - 1200 eV
Sample treatment Ar sputtering and annealing up to 800 K, mechanical cleaving tool
Photo of the PEAXIS station

Photo of the PEAXIS station

RIXS spectra of liquid acetone vibrations detected at the excitation energy of 531 eV and various θ angles. The intense peaks at the channel 1000 come from the elastic scattering, and the rest, equally-spaced peaks represent the vibrational excited final states in the electronic ground state. The RIXS resolution (combined with the beamline) at 531 eV is about 60 meV.

RIXS spectra of liquid acetone vibrations detected at the excitation energy of 531 eV and various θ angles. The intense peaks at the channel 1000 come from the elastic scattering, and the rest, equally-spaced peaks represent the vibrational excited final states in the electronic ground state. The RIXS resolution (combined with the beamline) at 531 eV is about 60 meV.

Coverage of PEAXIS plotted as a function of the incoming photon energy. Dashed lines indicate the position of the K-edge (blue) or an L-edge (red) of commonly measured elements.

Coverage of PEAXIS plotted as a function of the incoming photon energy. Dashed lines indicate the position of the K-edge (blue) or an L-edge (red) of commonly measured elements.


References:

  1. C. Schulz, K. Lieutenant, J. Xiao, T. Hofmann, D. Wong and K. Habicht, Characterization of the soft X-ray spectrometer PEAXIS at BESSY II; J. Synchrotron Rad. 27, 238-249 (2020). DOI: 10.1107/S1600577519014887
  2. K. Lieutenant, T. Hofmann, C. Zendler, C. Schulz, E. F. Aziz and K. Habicht, Numerical optimization of a RIXS spectrometer using raytracing simulations, Journal of Physics: Conference Series (2016). DOI: 10.1088/1742-6596/738/1/012104
  3. K. Lieutenant, T. Hofmann, C. Schulz, M. Yablonskikh, K. Habicht, E. F. Aziz, Design Concept of the High-Resolution End-station PEAXIS at BESSY II: Wide-Q-Range RIXS and XPS Measurements on Solids, Solutions, and Interfaces, J. El. Spec. Rel. Phen. (2016). DOI: 10.1016/j.elspec.2015.08.009