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Surface analysis

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Fig. 1: AFM topography image of wet-chemically structured ZnO:Al layer (S. Neubert).

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Fig. 2: 3D visualization (topography) of a periodically structured Si layer (S. Neubert).

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Fig. 3: 3D visualization (topography) of a contact finger on a textured Si wafer (laser scanning image) (H. Rhein).